Utpal Roy, Yunpeng Li, Bicheng Zhu. Building a rigorous foundation for performance assurance assessment techniques for "smart" manufacturing systems. In Jimmy Lin, Jian Pei, Xiaohua Hu, Wo Chang, Raghunath Nambiar, Charu Aggarwal, Nick Cercone, Vasant Honavar, Jun Huan, Bamshad Mobasher, Saumyadipta Pyne, editors, 2014 IEEE International Conference on Big Data, Big Data 2014, Washington, DC, USA, October 27-30, 2014. pages 1015-1023, IEEE, 2014. [doi]
Abstract is missing.