BLAME: A Blockchain-assisted Misbehavior Detection and Event Validation in VANETs

Ayan Roy, Sanjay Kumar Madria. BLAME: A Blockchain-assisted Misbehavior Detection and Event Validation in VANETs. In 22nd IEEE International Conference on Mobile Data Management, MDM 2021, Toronto, ON, Canada, June 15-18, 2021. pages 69-78, IEEE, 2021. [doi]

Abstract

Abstract is missing.