Current problems related to LSI functional testing

Robert W. Rozeboom. Current problems related to LSI functional testing. In Donald J. Humcke, J. Michael Galey, Stephen A. Szygenda, Pat O. Pistilli, Nitta P. Dooner, Judith G. Brinsfield, J. S. Olila, editors, Proceedings of the 13th Design Automation Conference, DAC '76, San Francisco, California, USA, June 28-30, 1976. pages 203-204, ACM, 1976. [doi]

Abstract

Abstract is missing.