Eric Rozier, William H. Sanders. A framework for efficient evaluation of the fault tolerance of deduplicated storage systems. In Robert S. Swarz, Philip Koopman, Michel Cukier, editors, IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2012, Boston, MA, USA, June 25-28, 2012. pages 1-12, IEEE Computer Society, 2012. [doi]
Abstract is missing.