Changhai Ru, Yong Zhang, Yu Sun 0001, Yu Zhong, Xueliang Sun, David Hoyle, Ian Cotton. Automated four-point probe measurement of nanowires inside a scanning electron microscope. In IEEE Conference on Automation Science and Engineering, CASE 2010, Toronto, ON, Canada, 21-24 August, 2010. pages 533-538, IEEE, 2010. [doi]
@inproceedings{RuZSZSHC10,
title = {Automated four-point probe measurement of nanowires inside a scanning electron microscope},
author = {Changhai Ru and Yong Zhang and Yu Sun 0001 and Yu Zhong and Xueliang Sun and David Hoyle and Ian Cotton},
year = {2010},
doi = {10.1109/COASE.2010.5584461},
url = {http://dx.doi.org/10.1109/COASE.2010.5584461},
researchr = {https://researchr.org/publication/RuZSZSHC10},
cites = {0},
citedby = {0},
pages = {533-538},
booktitle = {IEEE Conference on Automation Science and Engineering, CASE 2010, Toronto, ON, Canada, 21-24 August, 2010},
publisher = {IEEE},
isbn = {978-1-4244-5447-1},
}