Changhai Ru, Yong Zhang, Yu Sun 0001, Yu Zhong, Xueliang Sun, David Hoyle, Ian Cotton. Automated four-point probe measurement of nanowires inside a scanning electron microscope. In IEEE Conference on Automation Science and Engineering, CASE 2010, Toronto, ON, Canada, 21-24 August, 2010. pages 533-538, IEEE, 2010. [doi]
Abstract is missing.