Aiwu Ruan, Haiyang Huang, Jingwu Wang, Yifan Zhao. A Routability-Aware Algorithm for Both Global and Local Interconnect Resource Test and Diagnosis of Xilinx SRAM-FPGAs. J. Electronic Testing, 32(6):749-762, 2016. [doi]
@article{RuanHWZ16,
title = {A Routability-Aware Algorithm for Both Global and Local Interconnect Resource Test and Diagnosis of Xilinx SRAM-FPGAs},
author = {Aiwu Ruan and Haiyang Huang and Jingwu Wang and Yifan Zhao},
year = {2016},
doi = {10.1007/s10836-016-5622-0},
url = {http://dx.doi.org/10.1007/s10836-016-5622-0},
researchr = {https://researchr.org/publication/RuanHWZ16},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {32},
number = {6},
pages = {749-762},
}