Aiwu Ruan, Bairui Jie, Li Wan, Junhao Yang, Chuanyin Xiang, Zujian Zhu, Yu Wang. A bitstream readback-based automatic functional test and diagnosis method for Xilinx FPGAs. Microelectronics Reliability, 54(8):1627-1635, 2014. [doi]
@article{RuanJWYXZW14,
title = {A bitstream readback-based automatic functional test and diagnosis method for Xilinx FPGAs},
author = {Aiwu Ruan and Bairui Jie and Li Wan and Junhao Yang and Chuanyin Xiang and Zujian Zhu and Yu Wang},
year = {2014},
doi = {10.1016/j.microrel.2014.03.017},
url = {http://dx.doi.org/10.1016/j.microrel.2014.03.017},
researchr = {https://researchr.org/publication/RuanJWYXZW14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {8},
pages = {1627-1635},
}