Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
J. Ruan, N. Nolhier, G. J. Papaioannou, D. Trémouilles, V. Puyal, C. Villeneuve, T. Idda, Fabio Coccetti, Robert Plana. Accelerated lifetime test of RF-MEMS switches under ESD stress. Microelectronics Reliability, 49(9-11):1256-1259, 2009. [doi]