J. Ruan, N. Nolhier, G. J. Papaioannou, D. Trémouilles, V. Puyal, C. Villeneuve, T. Idda, Fabio Coccetti, Robert Plana. Accelerated lifetime test of RF-MEMS switches under ESD stress. Microelectronics Reliability, 49(9-11):1256-1259, 2009. [doi]
@article{RuanNPTPVICP09,
title = {Accelerated lifetime test of RF-MEMS switches under ESD stress},
author = {J. Ruan and N. Nolhier and G. J. Papaioannou and D. Trémouilles and V. Puyal and C. Villeneuve and T. Idda and Fabio Coccetti and Robert Plana},
year = {2009},
doi = {10.1016/j.microrel.2009.06.023},
url = {http://dx.doi.org/10.1016/j.microrel.2009.06.023},
tags = {testing, C++},
researchr = {https://researchr.org/publication/RuanNPTPVICP09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {9-11},
pages = {1256-1259},
}