2-D Shape Matching Using Asymmetric Wavelet-Based Dissimilarity Measure

Ibrahim El Rube, Mohamed Kamel, Maher Ahmed. 2-D Shape Matching Using Asymmetric Wavelet-Based Dissimilarity Measure. In Aurélio C. Campilho, Mohamed S. Kamel, editors, Image Analysis and Recognition: International Conference, ICIAR 2004, Porto, Portugal, September 29-October 1, 2004, Proceedings, Part II. Volume 3212 of Lecture Notes in Computer Science, pages 368-375, Springer, 2004. [doi]

@inproceedings{RubeKA04,
  title = {2-D Shape Matching Using Asymmetric Wavelet-Based Dissimilarity Measure},
  author = {Ibrahim El Rube and Mohamed Kamel and Maher Ahmed},
  year = {2004},
  url = {http://springerlink.metapress.com/openurl.asp?genre=article&issn=0302-9743&volume=3211&spage=368},
  tags = {rule-based},
  researchr = {https://researchr.org/publication/RubeKA04},
  cites = {0},
  citedby = {0},
  pages = {368-375},
  booktitle = {Image Analysis and Recognition: International Conference, ICIAR 2004, Porto, Portugal, September 29-October 1, 2004, Proceedings, Part II},
  editor = {Aurélio C. Campilho and Mohamed S. Kamel},
  volume = {3212},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {3-540-23240-0},
}