Bernhard Ruch, Gregor Pobegen, Christian Schleich, Tibor Grasser. Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge Pumping. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{RuchPSG20,
title = {Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge Pumping},
author = {Bernhard Ruch and Gregor Pobegen and Christian Schleich and Tibor Grasser},
year = {2020},
doi = {10.1109/IRPS45951.2020.9129513},
url = {https://doi.org/10.1109/IRPS45951.2020.9129513},
researchr = {https://researchr.org/publication/RuchPSG20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020},
publisher = {IEEE},
isbn = {978-1-7281-3199-3},
}