Ruchi, S. DasGupta. Sensitivity analysis of DRV for various configurations of SRAM. In 19th International Symposium on VLSI Design and Test, VDAT 2015, Ahmedabad, India, June 26-29, 2015. pages 1-5, IEEE, 2015. [doi]
@inproceedings{RuchiD15, title = {Sensitivity analysis of DRV for various configurations of SRAM}, author = {Ruchi and S. DasGupta}, year = {2015}, doi = {10.1109/ISVDAT.2015.7208059}, url = {http://dx.doi.org/10.1109/ISVDAT.2015.7208059}, researchr = {https://researchr.org/publication/RuchiD15}, cites = {0}, citedby = {0}, pages = {1-5}, booktitle = {19th International Symposium on VLSI Design and Test, VDAT 2015, Ahmedabad, India, June 26-29, 2015}, publisher = {IEEE}, isbn = {978-1-4799-1743-3}, }