Boundary Scan as a Test Solution in Microelectronics Curricula - researchr publication authors

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Andrzej Rucinski, Barbara Dziurla-Rucinska. Boundary Scan as a Test Solution in Microelectronics Curricula. In 1st IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2002), 29-31 January 2002, Christchurch, New Zealand. pages 214-218, IEEE Computer Society, 2002. [doi]

This author has not been identified. Look up 'Andrzej Rucinski' in GoogleThis author has not been identified. Look up 'Barbara Dziurla-Rucinska' in Google

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