Andrzej Rucinski, Barbara Dziurla-Rucinska. Boundary Scan as a Test Solution in Microelectronics Curricula. In 1st IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2002), 29-31 January 2002, Christchurch, New Zealand. pages 214-218, IEEE Computer Society, 2002. [doi]
Abstract is missing.