Probe point insertion for at-speed test

Elizabeth M. Rudnick, Vivek Chickermane, Janak H. Patel. Probe point insertion for at-speed test. In 10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA. pages 223-228, IEEE, 1992. [doi]

Abstract

Abstract is missing.