In-depth investigation of metallization aging in power MOSFETs

R. Ruffilli, Mounira Berkani, Philippe Dupuy, Stéphane Lefebvre, Y. Weber, Marc Legros. In-depth investigation of metallization aging in power MOSFETs. Microelectronics Reliability, 55(9-10):1966-1970, 2015. [doi]

Abstract

Abstract is missing.