Simulated Adversarial Testing of Face Recognition Models

Nataniel Ruiz, Adam Kortylewski, Weichao Qiu, Cihang Xie, Sarah Adel Bargal, Alan L. Yuille, Stan Sclaroff. Simulated Adversarial Testing of Face Recognition Models. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022, New Orleans, LA, USA, June 18-24, 2022. pages 4135-4145, IEEE, 2022. [doi]

Authors

Nataniel Ruiz

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Adam Kortylewski

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Weichao Qiu

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Cihang Xie

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Sarah Adel Bargal

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Alan L. Yuille

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Stan Sclaroff

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