Anant Rungta, Josep Altet, Enrique Barajas, Antonio Rubio, Xavier Aragonès, Diego Mateo. On the Use of Built-In Temperature Sensors to Monitor Aging in RF Circuits. In XXXIV Conference on Design of Circuits and Integrated Systems, DCIS 2019, Bilbao, Spain, November 20-22, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.