Image Analysis for Detecting Faulty Spots from Microarray Images

Salla Ruosaari, Jaakko Hollmén. Image Analysis for Detecting Faulty Spots from Microarray Images. In Steffen Lange, Ken Satoh, Carl H. Smith, editors, Discovery Science, 5th International Conference, DS 2002, Lübeck, Germany, November 24-26, 2002, Proceedings. Volume 2534 of Lecture Notes in Computer Science, pages 259-266, Springer, 2002. [doi]

Abstract

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