Michael W. Ruprecht, Guenther Benstetter, Douglas B. Hunt. A review of ULSI failure analysis techniques for DRAMs. Part II: Defect isolation and visualization. Microelectronics Reliability, 43(1):17-41, 2003. [doi]
@article{RuprechtBH03,
title = {A review of ULSI failure analysis techniques for DRAMs. Part II: Defect isolation and visualization},
author = {Michael W. Ruprecht and Guenther Benstetter and Douglas B. Hunt},
year = {2003},
doi = {10.1016/S0026-2714(02)00295-0},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00295-0},
tags = {analysis, reviewing},
researchr = {https://researchr.org/publication/RuprechtBH03},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {1},
pages = {17-41},
}