Georg Ruß, Rudolf Kruse. Feature Selection for Wheat Yield Prediction. In Max Bramer, Richard Ellis, Miltos Petridis, editors, Research and Development in Intelligent Systems XXVI, Incorporating Applications and Innovations in Intelligent Systems XVII, Peterhouse College, Cambridge, UK, 15-17 December 2009. pages 465-478, Springer, 2009. [doi]
Abstract is missing.