Rebecca L. Russell, Louis Y. Kim, Lei Hamilton, Tomo Lazovich, Jacob Harer, Onur Ozdemir, Paul M. Ellingwood, Marc W. McConley. Automated Vulnerability Detection in Source Code Using Deep Representation Learning. In M. Arif Wani, Mehmed Kantardzic, Moamar Sayed Mouchaweh, João Gama, Edwin Lughofer, editors, 17th IEEE International Conference on Machine Learning and Applications, ICMLA 2018, Orlando, FL, USA, December 17-20, 2018. pages 757-762, IEEE, 2018. [doi]
Abstract is missing.