Richard Ruzicka, Vaclav Simek, Lukás Sekanina. Behavior of CMOS polymorphic circuits in high temperature environment. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 447-452, IEEE, 2011. [doi]
Abstract is missing.