Efficient knowledge distillation with emphasized Radon features for wafer bin map classification

Sanghyun Ryoo, Jangwon Kim, Jaehyung Cho, Jongyul Lee, Junkee Hong, Soohee Han. Efficient knowledge distillation with emphasized Radon features for wafer bin map classification. Eng. Appl. of AI, 181:115299, 2026. [doi]

Abstract

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