Measurement of the fatigue-crack using image processing techniques

D. H. Ryu, T. W. Choi, Y. I. Kim, S. H. Nahm. Measurement of the fatigue-crack using image processing techniques. In Robert J. Howlett, Lakhmi C. Jain, editors, Fourth International Conference on Knowledge-Based Intelligent Information Engineering Systems & Allied Technologies, KES 2000, Brighton, UK, 30 August - 1 September 2000, Proceedings, 2 Volumes. pages 121-124, IEEE, 2000. [doi]

Abstract

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