Leonid Ryzhyk, John Keys, Balachandra Mirla, Arun Raghunath, Mona Vij, Gernot Heiser. Improved Device Driver Reliability Through Verification Reuse. In Paulo Veríssimo, Hakim Weatherspoon, editors, Proceedings of the Sixth Workshop on Hot Topics in System Dependability, HotDep 2010, Vancouver, BC, Canada, October 3, 2010. USENIX Association, 2010.
Abstract is missing.