Attention and Adaptive Bilinear Matching Network for Cross-Domain Few-Shot Defect Classification of Industrial Parts - researchr publication authors

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Liangbing Sa, Chongchong Yu, Ziyan Chen, Xia Zhao, Yafeng Yang. Attention and Adaptive Bilinear Matching Network for Cross-Domain Few-Shot Defect Classification of Industrial Parts. In International Joint Conference on Neural Networks, IJCNN 2021, Shenzhen, China, July 18-22, 2021. pages 1-8, IEEE, 2021. [doi]

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