Attention and Adaptive Bilinear Matching Network for Cross-Domain Few-Shot Defect Classification of Industrial Parts

Liangbing Sa, Chongchong Yu, Ziyan Chen, Xia Zhao, Yafeng Yang. Attention and Adaptive Bilinear Matching Network for Cross-Domain Few-Shot Defect Classification of Industrial Parts. In International Joint Conference on Neural Networks, IJCNN 2021, Shenzhen, China, July 18-22, 2021. pages 1-8, IEEE, 2021. [doi]

@inproceedings{SaYCZY21,
  title = {Attention and Adaptive Bilinear Matching Network for Cross-Domain Few-Shot Defect Classification of Industrial Parts},
  author = {Liangbing Sa and Chongchong Yu and Ziyan Chen and Xia Zhao and Yafeng Yang},
  year = {2021},
  doi = {10.1109/IJCNN52387.2021.9533518},
  url = {https://doi.org/10.1109/IJCNN52387.2021.9533518},
  researchr = {https://researchr.org/publication/SaYCZY21},
  cites = {0},
  citedby = {0},
  pages = {1-8},
  booktitle = {International Joint Conference on Neural Networks, IJCNN 2021, Shenzhen, China, July 18-22, 2021},
  publisher = {IEEE},
  isbn = {978-1-6654-3900-8},
}