Maryam Saadat-Safa, Tahoura Mosavirik, Shahin Tajik. Counterfeit Chip Detection using Scattering Parameter Analysis. In Maksim Jenihhin, Hana Kubátová, Nele Metens, Jaan Raik, Foisal Ahmed, Jan Belohoubek, editors, 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, Tallinn, Estonia, May 3-5, 2023. pages 99-104, IEEE, 2023. [doi]
@inproceedings{SaadatSafaMT23,
title = {Counterfeit Chip Detection using Scattering Parameter Analysis},
author = {Maryam Saadat-Safa and Tahoura Mosavirik and Shahin Tajik},
year = {2023},
doi = {10.1109/DDECS57882.2023.10139623},
url = {https://doi.org/10.1109/DDECS57882.2023.10139623},
researchr = {https://researchr.org/publication/SaadatSafaMT23},
cites = {0},
citedby = {0},
pages = {99-104},
booktitle = {26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, Tallinn, Estonia, May 3-5, 2023},
editor = {Maksim Jenihhin and Hana Kubátová and Nele Metens and Jaan Raik and Foisal Ahmed and Jan Belohoubek},
publisher = {IEEE},
isbn = {979-8-3503-3277-3},
}