WiP: Applicability of ISO Standard Side-Channel Leakage Tests to NIST Post-Quantum Cryptography - researchr publication authors

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Markku-Juhani O. Saarinen. WiP: Applicability of ISO Standard Side-Channel Leakage Tests to NIST Post-Quantum Cryptography. In IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2022, McLean, VA, USA, June 27-30, 2022. pages 69-72, IEEE, 2022. [doi]

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