Markku-Juhani O. Saarinen. WiP: Applicability of ISO Standard Side-Channel Leakage Tests to NIST Post-Quantum Cryptography. In IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2022, McLean, VA, USA, June 27-30, 2022. pages 69-72, IEEE, 2022. [doi]
@inproceedings{Saarinen22-1,
title = {WiP: Applicability of ISO Standard Side-Channel Leakage Tests to NIST Post-Quantum Cryptography},
author = {Markku-Juhani O. Saarinen},
year = {2022},
doi = {10.1109/HOST54066.2022.9839849},
url = {https://doi.org/10.1109/HOST54066.2022.9839849},
researchr = {https://researchr.org/publication/Saarinen22-1},
cites = {0},
citedby = {0},
pages = {69-72},
booktitle = {IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2022, McLean, VA, USA, June 27-30, 2022},
publisher = {IEEE},
isbn = {978-1-6654-8532-6},
}