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Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling

Wissam Sabbah, Faical Arabi, Oriol Avino-Salvado, Cyril Buttay, L. Théolier, Hervé Morel. Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling. Microelectronics Reliability, 76:444-449, 2017. [doi]

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