Soft error effects analysis and mitigation in VLIW safety-critical applications - researchr publication authors

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Davide Sabena, Matteo Sonza Reorda, Luca Sterpone. Soft error effects analysis and mitigation in VLIW safety-critical applications. In Lorena Garcia, editor, 22nd International Conference on Very Large Scale Integration, VLSI-SoC, Playa del Carmen, Mexico, October 6-8, 2014. pages 1-6, IEEE, 2014. [doi]

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