Davide Sabena, Matteo Sonza Reorda, Luca Sterpone. Soft error effects analysis and mitigation in VLIW safety-critical applications. In Lorena Garcia, editor, 22nd International Conference on Very Large Scale Integration, VLSI-SoC, Playa del Carmen, Mexico, October 6-8, 2014. pages 1-6, IEEE, 2014. [doi]
@inproceedings{SabenaRS14-0,
title = {Soft error effects analysis and mitigation in VLIW safety-critical applications},
author = {Davide Sabena and Matteo Sonza Reorda and Luca Sterpone},
year = {2014},
doi = {10.1109/VLSI-SoC.2014.7004194},
url = {http://dx.doi.org/10.1109/VLSI-SoC.2014.7004194},
researchr = {https://researchr.org/publication/SabenaRS14-0},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {22nd International Conference on Very Large Scale Integration, VLSI-SoC, Playa del Carmen, Mexico, October 6-8, 2014},
editor = {Lorena Garcia},
publisher = {IEEE},
isbn = {978-1-4799-6016-3},
}