Automatic CoDec generation to reduce test engineering cost

Ariel Sabiguero, Anthony Baire, César Viho. Automatic CoDec generation to reduce test engineering cost. STTT, 10(4):337-346, 2008. [doi]

Authors

Ariel Sabiguero

This author has not been identified. Look up 'Ariel Sabiguero' in Google

Anthony Baire

This author has not been identified. Look up 'Anthony Baire' in Google

César Viho

This author has not been identified. Look up 'César Viho' in Google