Ariel Sabiguero, Anthony Baire, César Viho. Automatic CoDec generation to reduce test engineering cost. STTT, 10(4):337-346, 2008. [doi]
@article{SabigueroBV08,
title = {Automatic CoDec generation to reduce test engineering cost},
author = {Ariel Sabiguero and Anthony Baire and César Viho},
year = {2008},
doi = {10.1007/s10009-008-0073-2},
url = {http://dx.doi.org/10.1007/s10009-008-0073-2},
tags = {testing},
researchr = {https://researchr.org/publication/SabigueroBV08},
cites = {0},
citedby = {0},
journal = {STTT},
volume = {10},
number = {4},
pages = {337-346},
}