Amit Sabne, Rajesh Tiwari, Abhijeet Shrivastava, Srivaths Ravi, Rubin A. Parekhji. A generic low power scan chain wrapper for designs using scan compression. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 135-140, IEEE Computer Society, 2010. [doi]
Abstract is missing.