Multi-GHz Interface Devices Should Be Tested Using External Test Resources

Manoj Sachdev. Multi-GHz Interface Devices Should Be Tested Using External Test Resources. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 1231, IEEE Computer Society, 2002. [doi]

@inproceedings{Sachdev02,
  title = {Multi-GHz Interface Devices Should Be Tested Using External Test Resources},
  author = {Manoj Sachdev},
  year = {2002},
  url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75431231.pdf},
  tags = {testing},
  researchr = {https://researchr.org/publication/Sachdev02},
  cites = {0},
  citedby = {0},
  pages = {1231},
  booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
  publisher = {IEEE Computer Society},
}