M. Sachdev. Deep sub-micron I::DDQ:: testing: issues and solutions. In European Design and Test Conference (ED&TC 97), Paris, France, 17-20 March 1997. pages 271-278, IEEE, 1997. [doi]
@inproceedings{Sachdev97,
title = {Deep sub-micron I::DDQ:: testing: issues and solutions},
author = {M. Sachdev},
year = {1997},
doi = {10.1109/EDTC.1997.582370},
url = {http://dx.doi.org/10.1109/EDTC.1997.582370},
tags = {testing},
researchr = {https://researchr.org/publication/Sachdev97},
cites = {0},
citedby = {0},
pages = {271-278},
booktitle = {European Design and Test Conference (ED&TC 97), Paris, France, 17-20 March 1997},
publisher = {IEEE},
}