Norio Sadachika, Shu Mimura, Akihiro Yumisaki, Koh Johguchi, Akihiro Kaya, Mitiko Miura-Mattausch, Hans Jürgen Mattausch. Prediction of Circuit-Performance Variations from Technology Variations for Reliable 100 nm SOC Circuit Design. IEICE Transactions, 94-C(3):361-367, 2011. [doi]
@article{SadachikaMYJKMM11,
title = {Prediction of Circuit-Performance Variations from Technology Variations for Reliable 100 nm SOC Circuit Design},
author = {Norio Sadachika and Shu Mimura and Akihiro Yumisaki and Koh Johguchi and Akihiro Kaya and Mitiko Miura-Mattausch and Hans Jürgen Mattausch},
year = {2011},
url = {http://search.ieice.org/bin/summary.php?id=e94-c_3_361},
tags = {design},
researchr = {https://researchr.org/publication/SadachikaMYJKMM11},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {94-C},
number = {3},
pages = {361-367},
}