Norio Sadachika, Shu Mimura, Akihiro Yumisaki, Koh Johguchi, Akihiro Kaya, Mitiko Miura-Mattausch, Hans Jürgen Mattausch. Prediction of Circuit-Performance Variations from Technology Variations for Reliable 100 nm SOC Circuit Design. IEICE Transactions, 94-C(3):361-367, 2011. [doi]
Abstract is missing.