Automation and yield of micron-scale self-assembly processes

Ehsan Saeedi, Samuel S. Kim, James R. Etzkorn, Deirdre R. Meldrum, Babak A. Parviz. Automation and yield of micron-scale self-assembly processes. In IEEE Conference on Automation Science and Engineering, CASE 2007, September 22-25, 2007. Scottsdale, Arizona, USA. pages 375-380, IEEE, 2007. [doi]

Abstract

Abstract is missing.