Shozo Saeki, Minoru Kawahara, Hirohisa Aman. Multi-attribute and Multi-label Deep Metric Learning via Pair-based and Proxy-based Losses. In 7th International Conference on Information and Computer Technologies, ICICT 2024, Honolulu, HI, USA, March 15-17, 2024. pages 57-63, IEEE, 2024. [doi]
Abstract is missing.