Juan Manuel Górriz Sáez, Javier Ramírez, Carlos García Puntonet, Fabian J. Theis, Elmar Wolfgang Lang. Bispectrum-Based Statistical Tests for VAD. In Wlodzislaw Duch, Janusz Kacprzyk, Erkki Oja, Slawomir Zadrozny, editors, Artificial Neural Networks: Formal Models and Their Applications - ICANN 2005, 15th International Conference, Warsaw, Poland, September 11-15, 2005, Proceedings, Part II. Volume 3697 of Lecture Notes in Computer Science, pages 541-546, Springer, 2005. [doi]
Abstract is missing.