David Saff. From developer s head to developer tests: characterization, theories, and preventing one more bug. In Richard P. Gabriel, David F. Bacon, Cristina Videira Lopes, Guy L. Steele Jr., editors, Companion to the 22nd Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2007, October 21-25, 2007, Montreal, Quebec, Canada. pages 811-812, ACM, 2007. [doi]
@inproceedings{Saff07,
title = {From developer s head to developer tests: characterization, theories, and preventing one more bug},
author = {David Saff},
year = {2007},
doi = {10.1145/1297846.1297900},
url = {http://doi.acm.org/10.1145/1297846.1297900},
tags = {testing},
researchr = {https://researchr.org/publication/Saff07},
cites = {0},
citedby = {0},
pages = {811-812},
booktitle = {Companion to the 22nd Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2007, October 21-25, 2007, Montreal, Quebec, Canada},
editor = {Richard P. Gabriel and David F. Bacon and Cristina Videira Lopes and Guy L. Steele Jr.},
publisher = {ACM},
isbn = {978-1-59593-865-7},
}