Quantifying Electrode Reliability During Brain-Computer Interface Operation

Hesam Sagha, Serafeim Perdikis, José del R. Millán, Ricardo Chavarriaga. Quantifying Electrode Reliability During Brain-Computer Interface Operation. IEEE Trans. Biomed. Engineering, 62(3):858-864, 2015. [doi]

Authors

Hesam Sagha

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Serafeim Perdikis

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José del R. Millán

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Ricardo Chavarriaga

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