Quantifying Electrode Reliability During Brain-Computer Interface Operation

Hesam Sagha, Serafeim Perdikis, José del R. Millán, Ricardo Chavarriaga. Quantifying Electrode Reliability During Brain-Computer Interface Operation. IEEE Trans. Biomed. Engineering, 62(3):858-864, 2015. [doi]

@article{SaghaPMC15,
  title = {Quantifying Electrode Reliability During Brain-Computer Interface Operation},
  author = {Hesam Sagha and Serafeim Perdikis and José del R. Millán and Ricardo Chavarriaga},
  year = {2015},
  doi = {10.1109/TBME.2014.2366554},
  url = {http://dx.doi.org/10.1109/TBME.2014.2366554},
  researchr = {https://researchr.org/publication/SaghaPMC15},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. Biomed. Engineering},
  volume = {62},
  number = {3},
  pages = {858-864},
}