In situ measurements of the complex permittivity of materials using reflection ellipsometry in the microwave band: theory (part I)

Florence Sagnard, Faroudja Bentabet, Christophe Vignat. In situ measurements of the complex permittivity of materials using reflection ellipsometry in the microwave band: theory (part I). IEEE T. Instrumentation and Measurement, 54(3):1266-1273, 2005. [doi]

Abstract

Abstract is missing.