A new line symmetry distance based pattern classifier - researchr publication authors

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Sriparna Saha, Sanghamitra Bandyopadhyay, Chingtham Tejbanta Singh. A new line symmetry distance based pattern classifier. In Proceedings of the International Joint Conference on Neural Networks, IJCNN 2008, part of the IEEE World Congress on Computational Intelligence, WCCI 2008, Hong Kong, China, June 1-6, 2008. pages 1425-1432, IEEE, 2008. [doi]

This author has not been identified. Look up 'Sriparna Saha' in GoogleThis author has not been identified. Look up 'Sanghamitra Bandyopadhyay' in GoogleThis author has not been identified. Look up 'Chingtham Tejbanta Singh' in Google

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